Optical characterization of Co-doped SnO2 multilayer thin films prepared by sol-gel method using spectroscopic ellipsometry technique

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 Optical characterization of Co-doped SnO2 multilayer thin films prepared by sol-gel method using spectroscopic ellipsometry technique دارای 6 صفحه می باشد و دارای تنظیمات در microsoft word می باشد و آماده پرینت یا چاپ است

فایل ورد Optical characterization of Co-doped SnO2 multilayer thin films prepared by sol-gel method using spectroscopic ellipsometry technique  کاملا فرمت بندی و تنظیم شده در استاندارد دانشگاه  و مراکز دولتی می باشد.

توجه : در صورت  مشاهده  بهم ريختگي احتمالي در متون زير ،دليل ان کپي کردن اين مطالب از داخل فایل ورد مي باشد و در فايل اصلي Optical characterization of Co-doped SnO2 multilayer thin films prepared by sol-gel method using spectroscopic ellipsometry technique،به هيچ وجه بهم ريختگي وجود ندارد


بخشی از متن Optical characterization of Co-doped SnO2 multilayer thin films prepared by sol-gel method using spectroscopic ellipsometry technique :


سال انتشار : 1397

تعداد صفحات : 5

چکیده مقاله:

Single- and four-layer Cobalt-doped tin dioxide (Co:SnO2) thin films deposited on glass substrates using sol-gel spin coating method. Spin coating was done at 1800 rpm and then thin films were dried at 150°C for 10 min on a hot plate. To synthesize the four-layer Co-doped SnO2 thin film coating and drying were repeated 4 times. Finally all deposited films were annealed at 450°C for 1 h in an air furnace. Spectroscopic ellipsometry was applied to determine optical properties including reflectance, refractiveindex and extinction and absorption coefficients. By using absorption coefficient values, the band gap energy of deposited thin films was calculated. Results showed by increasing number of layers from 1 to 4 the band gap energy decreased from 3.7 to 3.5 ev.

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